About M-ETK

The M-ETK provides the access to internal memory of a µC and allows for measurement of variables during runtime of the system as well as parameter modification.

In general, there are three main drivers for choosing an M-ETK as ECU access device for measurement and calibration tasks, instead of a pure SW solution like XCP on CAN/ETH.

  1. Minimized impact on the µC/SoC runtime and memory consumption.

  • Support of very short raster times down to 10 µs (cf. XCPonCAN with 1 ms).

  • Support of high number of variables, e.g. > 100.000 (cf. XCPonCAN with some 100 variables).

For more technical data on the M-ETK see Technical specifications